Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Published 2011 View Full Article

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Title
Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 519, Issue 18, Pages 6183-6189
Publisher
Elsevier BV
Online
2011-04-20
DOI
10.1016/j.tsf.2011.04.018

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