Porogen residues detection in optical properties of low-k dielectrics cured by ultraviolet radiation

Title
Porogen residues detection in optical properties of low-k dielectrics cured by ultraviolet radiation
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 518, Issue 15, Pages 4266-4272
Publisher
Elsevier BV
Online
2010-01-12
DOI
10.1016/j.tsf.2009.12.110

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started