Journal
THIN SOLID FILMS
Volume 518, Issue 23, Pages 6829-6832Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2010.06.060
Keywords
Thermoelectric properties; Thin films; Bi2Sr2Co2Oy; Epitaxial growth; Microstructure; Chemical solution deposition; X-ray diffraction; Transmission electron microscopy A
Categories
Funding
- NSFC of China [10904030]
- NSFC of Hebei Province [A2009000144]
- Hebei Education Department [ZD200909]
Ask authors/readers for more resources
Epitaxial Bi2Sr2Co2Oy thin films with excellent c-axis and ab-plane alignments have been grown on (001) LaAlO3 substrates by chemical solution deposition using metal acetates as starting materials. Microstructure studies show that the resulting Bi2Sr2Co2Oy films have a well-ordered layer structure with a flat and clear interface with the substrate. Scanning electron microscopy of the films reveals a step-terrace surface structure without any microcracks and pores. At room temperature, the epitaxial Bi2Sr2Co2Oy films exhibit a resistivity of about 2 m Omega cm and a seebeck coefficient of about 115 mu V/K comparable to those of single crystals. (C) 2010 Elsevier B.V. All rights reserved
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
