Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films

Published 2010 View Full Article

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Title
Combined ellipsometry and X-ray related techniques for studies of ultrathin organic nanocomposite films
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 518, Issue 19, Pages 5509-5514
Publisher
Elsevier BV
Online
2010-04-28
DOI
10.1016/j.tsf.2010.04.033

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