A structural study of amorphous In2O3–ZnO films by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

Published 2007 View Full Article

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Title
A structural study of amorphous In2O3–ZnO films by grazing incidence X-ray scattering (GIXS) with synchrotron radiation
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 516, Issue 17, Pages 5818-5821
Publisher
Elsevier BV
Online
2007-11-14
DOI
10.1016/j.tsf.2007.10.046

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