Journal
THIN SOLID FILMS
Volume 516, Issue 21, Pages 7770-7776Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2008.05.054
Keywords
atomic force microscopy; power spectral density; polymer multilayers; alginate; scleroglucan; chitosan
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Funding
- The Norwegian Research Council [134674/140, 121894/420]
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The morphology of polymer multilayer surfaces has been studied by quantitative analysis of atomic force microscopy (AFM) topographs. Multilayers; were prepared for three different systems: chitosan-alginate, poly (L-lysine)-alginate and chitosan-scleralclehyde polymer pairs with up to 10 layer pairs. These utilized either an electrostatic dominated mechanism for the chitosan-alginate and poly(L-lysine)-alginate pairs, or covalent linkage for the chitosan-scleralclehyde pair. The surface structures were studied by evaluating the power spectral density (PSD) obtained from the height autocorrelation function calculated from the AFM topographs. By fitting the averaged PSD to the k-correlation model. information related to surface features such as pore size was extracted. Additionally, the dimensions of pronounced network strands were extracted from the peak at large spatial frequency observed for some of the multilayers. The analysis shows that quantitative information about properties of network like surfaces can be extracted, i.e. development of mean pore sizes of the multilayers prepared using stiff polymers and that such pore size can be tuned by choosing the components of the polymer pairs employed and/or the number of layer pairs. (c) 2008 Elsevier B.V. All rights reserved.
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