Evidences of the defect pool model in the dark current-voltage characteristics of hydrogenated amorphous silicon based p-i-n devices

Published 2008 View Full Article

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Title
Evidences of the defect pool model in the dark current-voltage characteristics of hydrogenated amorphous silicon based p-i-n devices
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 516, Issue 21, Pages 7708-7714
Publisher
Elsevier BV
Online
2008-04-09
DOI
10.1016/j.tsf.2008.04.002

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