Journal
SURFACE SCIENCE
Volume 614, Issue -, Pages 1-11Publisher
ELSEVIER
DOI: 10.1016/j.susc.2013.03.023
Keywords
Thin film growth; Oxide surfaces; Low energy electron microscopy; Low energy electron diffraction
Categories
Funding
- LDRD program at Sandia National Laboratories
- U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Science and Engineering
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We use low energy electron microscopy (LEEM) and low energy electron diffraction (LEED) to characterize the initial stages of iron oxide film growth on oxygen-deficient YSZ(001). The films are grown by Fe deposition in a background of 10(-6) to 10(-5) Torr O-2. The first layer grows as FeO(111) with four non-equivalent domains arising from two rotational orientations and two stacking sequences. Uniform spreading of 2-D islands is observed by initiating growth at similar to 1000 degrees C and raising the temperature to 1110-1145 degrees C during Fe deposition. The growth is anisotropic with the fast growth direction depending strongly on both the rotational and stacking domain structure, most likely the result of preferred O-2 dissociation at specific island edge configurations. The Fe0(111) film has a distinct LEEM-IV spectrum with three well-defined maxima and is easily distinguished from the YSZ(001) substrate. The coarsening of small islands (<10 nm diameter) at temperatures above 1160 degrees C rotates the film orientation by 15 degrees with respect to the substrate and reduces the coverage by about one half suggesting a dewetting process. After completion of the first layer, islands with a surface lattice constant corresponding to Fe3O4/gamma-Fe2O3 appear with a LEEM-N fingerprint different from both FeO(111) and the YSZ(001) substrate. (C) 2013 Elsevier B.V. All rights reserved.
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