Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic properties

Title
Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic properties
Authors
Keywords
-
Journal
SURFACE SCIENCE
Volume 606, Issue 3-4, Pages 125-129
Publisher
Elsevier BV
Online
2011-11-04
DOI
10.1016/j.susc.2011.10.022

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