III–V on silicon: Observation of gallium phosphide anti-phase disorder by low-energy electron microscopy

Published 2011 View Full Article

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Title
III–V on silicon: Observation of gallium phosphide anti-phase disorder by low-energy electron microscopy
Authors
Keywords
-
Journal
SURFACE SCIENCE
Volume 605, Issue 15-16, Pages L38-L41
Publisher
Elsevier BV
Online
2011-05-11
DOI
10.1016/j.susc.2011.05.002

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