Journal
SURFACE SCIENCE
Volume 604, Issue 21-22, Pages L63-L66Publisher
ELSEVIER
DOI: 10.1016/j.susc.2010.08.002
Keywords
ZnO heteroepitaxy; Epitaxial relationship; Band offsets; Band alignment
Categories
Funding
- Australian Research Council
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Pulsed laser deposited ZnO layers on 6H-SiC substrates showed the six-fold symmetry, indicating a two-dimensional epitaxial growth mode. X-ray photoelectron spectroscopy was employed to study the valence band discontinuity and interface formation in the ZnO/6H-SiC heterojunction. The valence band offset was measured to be 1.38 +/- 0.28 eV, leading to a conduction band offset value of 1.01 +/- 0.28 eV. The resulting band lineup in epitaxial ZnO/6H-SiC heterojunction is determined to be of staggered-type alignment. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
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