Improved ARXPS data interpretation using near-surface measuring angles

A promising concept for using near-surface measuring angles in angle-resolved x-ray photoelectron spectroscopy considering elastic scattering effects

(2011) S. Oswald et al.   JOURNAL OF APPLIED PHYSICS

Electron Spectroscopy of Corrugated Solid Surfaces

(2010) J. ZEMEK   ANALYTICAL SCIENCES

Growth studies of Ti-based films deposited on Si and SiO2 using angle-resolved XPS

(2010) S. Oswald   SURFACE AND INTERFACE ANALYSIS

Application of angle-resolved X-ray photon electron spectroscopy for interface and layer growth studies demonstrated on Ti/Ta-based films deposited on SiO2

(2009) S. Oswald et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

Modeling of complex surface structures for ARXPS

(2008) S. Oswald et al.   SURFACE AND INTERFACE ANALYSIS

Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces: Monte Carlo calculations

(2008) K. Olejnik et al.   SURFACE SCIENCE

Photoelectron spectroscopy from randomly corrugated surfaces

(2008) J. Zemek et al.   SURFACE SCIENCE

Simulation of rough nanostructured surfaces for ARXPS

(2007) S. Oswald   SURFACE SCIENCE