Topography and field effects in secondary ion mass spectrometry Part II: insulating samples

Published 2011 View Full Article

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Title
Topography and field effects in secondary ion mass spectrometry Part II: insulating samples
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume 44, Issue 2, Pages 238-245
Publisher
Wiley
Online
2011-10-24
DOI
10.1002/sia.3833
References
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