Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si

Title
Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume 42, Issue 8, Pages 1393-1401
Publisher
Wiley
Online
2010-02-19
DOI
10.1002/sia.3115

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started