XPS spectromicroscopy: exploiting the relationship between images and spectra

Published 2008 View Full Article

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Title
XPS spectromicroscopy: exploiting the relationship between images and spectra
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume 40, Issue 3-4, Pages 478-481
Publisher
Wiley
Online
2008-02-20
DOI
10.1002/sia.2731

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