Characterizations of bismuth telluride films from Mott-Schottky plot and spectroscopic ellipsometry

Title
Characterizations of bismuth telluride films from Mott-Schottky plot and spectroscopic ellipsometry
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume 40, Issue 3-4, Pages 593-596
Publisher
Wiley
Online
2008-01-25
DOI
10.1002/sia.2715

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