17 keV photon induced damage of Bi-2212 whiskers by synchrotron μ-beam exposure

Title
17 keV photon induced damage of Bi-2212 whiskers by synchrotron μ-beam exposure
Authors
Keywords
-
Journal
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
Volume 24, Issue 3, Pages 035009
Publisher
IOP Publishing
Online
2010-12-24
DOI
10.1088/0953-2048/24/3/035009

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