Journal
STATISTICS & PROBABILITY LETTERS
Volume 79, Issue 8, Pages 1120-1124Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.spl.2009.01.006
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A new concept, called silhouette, and the related parameterization are introduced and studied. Applications show how to extend maximally the mean-variance domain of a count distribution, and how to construct a single variable for ally mean-variance and any requirements on distribution shape. (C) 2009 Elsevier B.V. All rights reserved.
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