Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations

Published 2013 View Full Article

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Title
Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations
Authors
Keywords
-
Journal
SOLID-STATE ELECTRONICS
Volume 89, Issue -, Pages 171-176
Publisher
Elsevier BV
Online
2013-09-18
DOI
10.1016/j.sse.2013.08.008

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