Impact of Ge–Sb–Te compound engineering on the set operation performance in phase-change memories

Title
Impact of Ge–Sb–Te compound engineering on the set operation performance in phase-change memories
Authors
Keywords
-
Journal
SOLID-STATE ELECTRONICS
Volume 58, Issue 1, Pages 11-16
Publisher
Elsevier BV
Online
2010-12-19
DOI
10.1016/j.sse.2010.11.033

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