Improved infrared (IR) microscope measurements and theory for the micro-electronics industry

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Improved infrared (IR) microscope measurements and theory for the micro-electronics industry
Authors
Keywords
-
Journal
SOLID-STATE ELECTRONICS
Volume 54, Issue 1, Pages 63-66
Publisher
Elsevier BV
Online
2009-10-13
DOI
10.1016/j.sse.2009.09.022

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.