Effect of defect content on the unipolar resistive switching characteristics of ZnO thin film memory devices

Published 2012 View Full Article

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Title
Effect of defect content on the unipolar resistive switching characteristics of ZnO thin film memory devices
Authors
Keywords
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Journal
SOLID STATE COMMUNICATIONS
Volume 152, Issue 17, Pages 1630-1634
Publisher
Elsevier BV
Online
2012-05-04
DOI
10.1016/j.ssc.2012.04.073

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