Thickness dependence of the resistive switching behavior of nonvolatile memory device structures based on undoped ZnO films

Published 2011 View Full Article

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Title
Thickness dependence of the resistive switching behavior of nonvolatile memory device structures based on undoped ZnO films
Authors
Keywords
-
Journal
SOLID STATE COMMUNICATIONS
Volume 151, Issue 23, Pages 1739-1742
Publisher
Elsevier BV
Online
2011-09-03
DOI
10.1016/j.ssc.2011.08.036

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