Secondary ion mass spectrometry and X-ray photoelectron spectroscopy studies on TiO2 and nitrogen doped TiO2 thin films

Published 2010 View Full Article

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Title
Secondary ion mass spectrometry and X-ray photoelectron spectroscopy studies on TiO2 and nitrogen doped TiO2 thin films
Authors
Keywords
-
Journal
SOLID STATE COMMUNICATIONS
Volume 151, Issue 3, Pages 245-249
Publisher
Elsevier BV
Online
2010-11-27
DOI
10.1016/j.ssc.2010.11.017

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