Origin of swift heavy ion induced stress in textured ZnO thin films: An in situ X-ray diffraction study

Published 2010 View Full Article

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Title
Origin of swift heavy ion induced stress in textured ZnO thin films: An in situ X-ray diffraction study
Authors
Keywords
-
Journal
SOLID STATE COMMUNICATIONS
Volume 150, Issue 37-38, Pages 1751-1754
Publisher
Elsevier BV
Online
2010-07-22
DOI
10.1016/j.ssc.2010.07.026

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