Thermal boundary resistance at Si/Ge interfaces by molecular dynamics simulation

Title
Thermal boundary resistance at Si/Ge interfaces by molecular dynamics simulation
Authors
Keywords
-
Journal
AIP Advances
Volume 5, Issue 4, Pages 047102
Publisher
AIP Publishing
Online
2015-04-02
DOI
10.1063/1.4916974

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started