Which process metrics can significantly improve defect prediction models? An empirical study

Title
Which process metrics can significantly improve defect prediction models? An empirical study
Authors
Keywords
Software metrics, Product metrics, Process metrics , Defect prediction models, Software defect prediction
Journal
SOFTWARE QUALITY JOURNAL
Volume 23, Issue 3, Pages 393-422
Publisher
Springer Nature
Online
2014-06-19
DOI
10.1007/s11219-014-9241-7

Ask authors/readers for more resources

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now