A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects
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Title
A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects
Authors
Keywords
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Journal
SENSORS
Volume 14, Issue 1, Pages 1295-1321
Publisher
MDPI AG
Online
2014-01-13
DOI
10.3390/s140101295
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