A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects

Title
A One-Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects
Authors
Keywords
-
Journal
SENSORS
Volume 14, Issue 1, Pages 1295-1321
Publisher
MDPI AG
Online
2014-01-13
DOI
10.3390/s140101295

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now