Hard x-ray emission spectroscopy: a powerful tool for the characterization of magnetic semiconductors
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Title
Hard x-ray emission spectroscopy: a powerful tool for the characterization of magnetic semiconductors
Authors
Keywords
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Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 29, Issue 2, Pages 023002
Publisher
IOP Publishing
Online
2014-01-17
DOI
10.1088/0268-1242/29/2/023002
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