High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots

Published 2010 View Full Article

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Title
High resolution photocurrent imaging by atomic force microscopy on the example of single buried InAs quantum dots
Authors
Keywords
-
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 25, Issue 6, Pages 065010
Publisher
IOP Publishing
Online
2010-05-19
DOI
10.1088/0268-1242/25/6/065010

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