Journal
SCRIPTA MATERIALIA
Volume 66, Issue 3-4, Pages 190-193Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2011.10.037
Keywords
X-ray diffraction; Grain boundaries; Crystallization; Nanostructure; Ceramic thin films
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Funding
- Swiss National Science Foundation [PA00P2-134153]
- Shore Research Fund
- Swiss National Science Foundation (SNF) [PA00P2_134153] Funding Source: Swiss National Science Foundation (SNF)
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The two main mechanisms that cause the broadening of X-ray diffraction profiles in polycrystalline materials, i.e. those due to finite grain size and local strain inhomogeneities, are usually considered independently. In this paper, we discuss the potential interrelationship between them and propose a phenomenological equation which links the dispersion of strain distribution to grain size via the width of distorted regions near grain boundaries and the lattice disorder therein. The developed approach is applied to characterize crystallization processes in Gd-doped ceria films. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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