Invited Review Article: Methods for imaging weak-phase objects in electron microscopy

Title
Invited Review Article: Methods for imaging weak-phase objects in electron microscopy
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 11, Pages 111101
Publisher
AIP Publishing
Online
2013-11-23
DOI
10.1063/1.4830355

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started