An atom trap trace analysis system for measuring krypton contamination in xenon dark matter detectors

Title
An atom trap trace analysis system for measuring krypton contamination in xenon dark matter detectors
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 9, Pages 093105
Publisher
AIP Publishing
Online
2013-09-28
DOI
10.1063/1.4821879

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