Quantitative scanning thermal microscopy based on determination of thermal probe dynamic resistance

DC Experiments in Quantitative Scanning Thermal Microscopy

(2013) J. Juszczyk et al.   INTERNATIONAL JOURNAL OF THERMOPHYSICS

Quantitative Thermometry of Nanoscale Hot Spots

(2012) Fabian Menges et al.   NANO LETTERS

Scanning thermal microscopy of individual silicon nanowires

(2011) Etienne Puyoo et al.   JOURNAL OF APPLIED PHYSICS

A noncontact thermal microprobe for local thermal conductivity measurement

(2011) Yanliang Zhang et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Thermal exchange radius measurement: Application to nanowire thermal imaging

(2010) Etienne Puyoo et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices

(2009) P. Janus et al.   MICROELECTRONIC ENGINEERING

High-Density Through Silicon Vias for 3-D LSIs

(2009) Mitsumasa Koyanagi et al.   PROCEEDINGS OF THE IEEE

Through-Silicon Via (TSV)

(2009) Makoto Motoyoshi   PROCEEDINGS OF THE IEEE

Thermal characterization of micro-structured NiTi samples by 3ω scanning thermal microscopy

(2008) J. Gibkes et al.   European Physical Journal-Special Topics

Temperature-dependent quantitative 3ω scanning thermal microscopy: Local thermal conductivity changes in NiTi microstructures induced by martensite-austenite phase transition

(2008) M. Chirtoc et al.   REVIEW OF SCIENTIFIC INSTRUMENTS