Extending the 3ω method: Thermal conductivity characterization of thin films

Title
Extending the 3ω method: Thermal conductivity characterization of thin films
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 8, Pages 084904
Publisher
AIP Publishing
Online
2013-08-13
DOI
10.1063/1.4817582

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