The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes

Title
The extended wedge method: Atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 5, Pages 055108
Publisher
AIP Publishing
Online
2013-05-15
DOI
10.1063/1.4804163

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