Measuring the three-photon self-annihilation fraction of positronium in and above thin films: A tool for determining film morphology

Published 2013 View Full Article

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Title
Measuring the three-photon self-annihilation fraction of positronium in and above thin films: A tool for determining film morphology
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 84, Issue 10, Pages 103908
Publisher
AIP Publishing
Online
2013-10-25
DOI
10.1063/1.4825371
References
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