☆ 4.5 Article

Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility

REVIEW OF SCIENTIFIC INSTRUMENTS (2012)

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS

Volume 83, Issue 12, Pages -

Publisher

AIP Publishing

DOI: 10.1063/1.4772577

Keywords

Funding

(U.S.) Department of Energy/National Nuclear Security Administration (DOE/NNSA) [DE-FG03-97SF21388, DE-FG52-97SF21388, DE-NA0000970]
DOE-NNSA
DOE-Basic Energy Sciences (BES)
National Science Foundation (NSF)
DOE-BES [DE-AC02-06CH11357]

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Abstract

The Advanced Photon Source (APS) at Argonne National Laboratory was used to obtain real-time, high-resolution x-ray diffraction measurements to determine the microscopic response of shock-compressed single crystals. Disk shaped samples were subjected to plane shock wave compression by impacting them with half-inch diameter, flat-faced projectiles. The projectiles were accelerated to velocities ranging between 300 and 1200 m/s using a compact powder gun designed specifically for use at a synchrotron facility. The experiments were designed to keep the sample probed volume under uniaxial strain and constant stress for a duration longer than the 153.4 ns spacing between x-ray bunches. X-rays from a single pulse (<100 ps duration) out of the periodic x-ray pulses emitted by the synchrotron were used for the diffraction measurements. A synchronization and x-ray detection technique was developed to ensure that the measured signal was obtained unambiguously from the desired x-ray pulse incident on the sample while the sample was in a constant uniaxial strain state. The synchronization and x-ray detection techniques described can be used for a variety of x-ray measurements on shock compressed solids and liquids at the APS. Detailed procedures for applying the Bragg-Brentano parafocusing approach to single crystals at the APS are presented. Analytic developments to determine the effects of crystal substructure and non-ideal geometry on the diffraction pattern position and shape are presented. Representative real-time x-ray diffraction data, indicating shock-induced microstructural changes, are presented for a shock-compressed Al(111) sample. The experimental developments presented here provided, in part, the impetus for the Dynamic Compression Sector (DCS) currently under development at the APS. Both the synchronization/x-ray detection methods and the analysis equations for high-resolution single crystal x-ray diffraction can be used at the DCS. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4772577]

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Time resolved insights into abnormal grain growth by in situ synchrotron measurements

M. Vollmer, S. Degener, A. Bolender, A. Bauer, A. Liehr, A. Stark, N. Schell, P. Barriobero-Vila, G. Requena, T. Niendorf

Summary: A recently developed strategy for promoting abnormal grain growth during cyclic heat treatment has the potential to manufacture single crystals with a size of several centimeters. However, there is still a lack of detailed understanding of the elementary mechanisms involved in this kind of abnormal grain growth. This study provides time resolved insights into the interplay of these mechanisms for the first time, using in situ synchrotron high energy X-ray diffraction analysis. The results not only deepen our understanding of abnormal grain growth, but also lay the foundation for improving the efficiency of the cyclic heat treatment process and obtaining even larger single crystals.

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