An in-vacuum x-ray diffraction microscope for use in the 0.7–2.9 keV range

Title
An in-vacuum x-ray diffraction microscope for use in the 0.7–2.9 keV range
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 3, Pages 033703
Publisher
AIP Publishing
Online
2012-03-15
DOI
10.1063/1.3688655

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started