Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

Title
Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 12, Pages 123708
Publisher
AIP Publishing
Online
2012-12-20
DOI
10.1063/1.4770140

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