A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

Published 2011 View Full Article

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Title
A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 11, Pages 113708
Publisher
AIP Publishing
Online
2011-12-01
DOI
10.1063/1.3663611
References
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