Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

Title
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 7, Pages 073703
Publisher
AIP Publishing
Online
2011-07-13
DOI
10.1063/1.3606399

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