Angled long tip to tuning fork probes for atomic force microscopy in various environments

Title
Angled long tip to tuning fork probes for atomic force microscopy in various environments
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 4, Pages 043701
Publisher
AIP Publishing
Online
2011-04-08
DOI
10.1063/1.3569765

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