Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy

Title
Digitally tunable, wide-band amplitude, phase, and frequency detection for atomic-resolution scanning force microscopy
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 7, Pages 073704
Publisher
AIP Publishing
Online
2010-07-15
DOI
10.1063/1.3458009

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