High-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray diffraction method

Title
High-pressure in situ structure measurement of low-Z noncrystalline materials with a diamond-anvil cell by an x-ray diffraction method
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 4, Pages 043906
Publisher
AIP Publishing
Online
2010-04-14
DOI
10.1063/1.3361037

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started