A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K

Authors

Keywords

Journal

Volume 81, Issue 5, Pages 053703

Publisher

AIP Publishing

Online

2010-05-18

DOI

10.1063/1.3427217

References

View 2 related references

Discuss science. Find collaborators. Network.

Join a conversation

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started