Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy

Title
Determining concentration depth profiles of thin foam films with neutral impact collision ion scattering spectroscopy
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 81, Issue 11, Pages 113907
Publisher
AIP Publishing
Online
2010-11-21
DOI
10.1063/1.3491736

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