Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography

Published 2009 View Full Article

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Title
Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 4, Pages 043703
Publisher
AIP Publishing
Online
2009-04-11
DOI
10.1063/1.3115182

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