Making a commercial atomic force microscope more accurate and faster using positive position feedback control

Published 2009 View Full Article

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Title
Making a commercial atomic force microscope more accurate and faster using positive position feedback control
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 6, Pages 063705
Publisher
AIP Publishing
Online
2009-06-24
DOI
10.1063/1.3155790
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