Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope

Published 2009 View Full Article

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Title
Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 80, Issue 11, Pages 113702
Publisher
AIP Publishing
Online
2009-11-03
DOI
10.1063/1.3251272

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